Eye Know How, Germany


Hermann Ruckerbauer

Mr. Ruckerbauer has over twenty years of experience in high speed measurement and simulation especially on DRAM related interfaces. After receiving his Bachelor Degree in Micro System Technology from the University of Applied Science in Regensburg he was doing design analysis and application testing for several memory generations at Siemens/Infineon.

He holds many patents and was awarded in the category 'Outstanding Single Patent' for the patent on the “Temperature dependent Self Refresh” in DDR Memory devices from Infineon in 2005.

Find out more here.