CIMS, Hong Kong (Represented only in India)

 

CIMS HK: Automated Optical Inspection Systems (AOI)

Automated optical inspection (AOI) is a crucial step for PCB manufacturers, during which inner and outer layers are carefully inspected to assure functionality and reliability resulting in high yield production. 

CIMS offers wide range of AOI systems for all segments of PCB industry – from IC Substrates and HDI, flex and rigid flex to mainstream multi-layer boards. CIMS AOIs are helping our customers to dramatically increase yield of PCB manufacturing process as well as improve quality of the final product. Various models available are: 

 

Galaxy 4Cχ 

Galaxy 4Cχ, equipped with color camera, is designed to support high volume manufacturing of next generation IC Substrates. It is capable to scan down to 4 µm line/space width technology. 

 

Galaxy 5Cχ 

Galaxy 5Cχ, equipped with color camera, is designed to support high volume manufacturing of highly advanced IC Substrates. It is capable to scan down to 5 µm line/space width technology. 

 

Galaxy 7Cχ 

Galaxy 7Cχ, equipped with color camera, is designed to support high volume manufacturing of advanced IC Substrates. It is capable to scan down to 7 µm line/space width technology. 

 

Galaxy 10Cχ 

Galaxy 10Cχ, equipped with color camera, is designed to support high volume manufacturing of advanced IC Substrates and ultra fine line HDI. It is capable to scan down to 10 µm line/space width technology. 

CIMS HK: Automated Optical / Final / Verification (AOI / AFI / AVI) Inspection Systems (Only in India)

CIMS AOI, AFI and AVI systems combined with 2D and 3D metrology tools are capable to scan lines of down to 4 µm and are widely used in all segments of PCB industry.

CIMS HK: AI-Powered Hybrid Verification Systems

 

AIVR 4μ 

AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 4μ is designed to support high volume manufacturing of IC Substrates and optimized for verification of 4 ~ 15 µm line/space width technology. 

 

AIVR 5μ 

AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 5μ is designed to support high volume manufacturing of IC Substrates and optimized for verification of 5 ~ 25 µm line/space width technology. 

 

AIVR 7μ 

AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 7μ is designed to support high volume manufacturing of IC Substrates and optimized for verification of 7 ~ 25 µm line/space width technology. 

 

AIVR 10μ 

AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 10μ is designed to support high volume manufacturing of HDI and IC Substrates and optimized for verification of 10 ~ 25 µm line/space width technology. 

 

CIMS HK: Photo Tools Inspection Systems

 

Phoenix PT/Micro 

Phoenix PT/Micro, CIMS photo-tools AOI system, is designed to inspect high-resolution film artworks and glass masks. It is capable to scan down to 7 µm line/space width technology. 

 

Phoenix PT+ 

Phoenix PT+, CIMS photo-tools AOI system, is designed to inspect high-resolution film artworks and glass masks. It is capable to scan down to 12.5 µm line/space width technology. 

 

CIMS HK: Hybrid Verification Systems

VVR for ICS 

VVR, CIMS hybrid-mode verification station that combines virtual and physical verification within a single workstation. VVR for ICS is designed to support high volume manufacturing of IC Substrates and optimized for verification of 4 ~ 15 µm line/space width technology.